Registration is now open for the Electron Microscopy & Microanalysis Workshop, hosted by RJ Lee Group (RJLG) and Hitachi. This two-day event, “Problem Solving in the Nanotechnology World,” will be held on June 16-17, 2009, at the Comfort Inn Conference Center and RJLG’s headquarters’ in Monroeville. A third day will be open for one-on-one meetings with Hitachi and RJ Lee Group experts.
The sessions will provide a forum on the most recent advances in nanomaterial characterization, nanoparticle characterization and related sample preparation. A high-profile list of leading scientists and researchers in the industry has been scheduled for the workshop. Speakers include Dr. Eric Grulke of University of Kentucky, Dr. Judith Yang of University of Pittsburgh, Dr. Jon McCarthy of University of Wisconsin, Dr. Lisa Porter of Carnegie Mellon University, Dr. Scott Story of U.S. Steel, Dr. Joe Conny from NIST, plus Dr. Brian Strohmeier and Gary Casuccio of RJ Lee Group, Inc. There will be additional time scheduled for breakout sessions, laboratory tours and demonstrations on state-of-the-art Hitachi instrumentation. Posters are strongly encouraged on a variety of nanotechnology topics and will be displayed at the Sessions.
For complete workshop details, visit Electron Microscopy & Microanalysis Workshop.
